Zeiss Unveils New Ion Beam Microscope Capabilities
The updated microscopes will cover a wider range of tasks across analytics, tomography, sample preparation, and data integrity.
Zeiss, an optics and optoelectronics technology enterprise company, introduced additional functions for its Zeiss ion beam microscopes, making the devices capable of handling engineering materials, energy materials, soft materials, geosciences covering megatrends in additive manufacturing, etc. for analytics, tomography, sample preparation, and data integrity.
The microscopes will be equipped with secondary ion mass spectrometry solutions for elemental analysis and time-of-flight secondary ion mass spectrometry detection for analytical purposes. Along with this, the tomography functions of the microscopes will be enhanced by workflows for 3D tomography to ensure quality 3D data volume generation with quantified and calibrated measurement of z-slice thickness for reconstruction of tomogram slices into a reconstructed volume.
A new loading station and sample holder for transmission electron microscopy (TEM) lamella preparation leads to an easier transition of the sample to the TEM for further analysis. Data integrity is also enhanced with ZEISS ZEN Intellesis, a machine learning-based segmentation software that ensures data integrity is maintained as data acquisition speed and quality are improved.
Source: Zeiss
