March 2008 Editor's Picks: Eriez Magnetics and Netzsch Fine Particle Technology

Eriez Magnetics
Inspection system adapts to products
The "XR-21" series cabinet inspection system from Eriez Magnetics (Erie, PA) incorporates adaptive algorithms that enhance the machine's performance. Ray Spurgeon, manager of inspection systems at Eriez, says the system adapts automatically to product changes. The algorithms automatically recalculate parameters as each product is inspected, thus minimizing operator interface and the potential for error, according to Spurgeon.

The algorithms complement the system's low-energy X-ray generators to obtain high resolution and sharp images. The algorithms help users disregard environmental factors and nonhomogenous products to better identify broken and contaminated products.

In addition, the system includes connectors for USB and network interfaces, which can be used for memory devices and external instruments. The connectors allow customers to receive real-time technical support. The system also features user-friendly touch-screen technology and does not need frequent calibration.

Netzsch Fine Particle Technology
Bead mill produces nanoparticles
The "MicroCer" laboratory mill from Netzsch Fine Particle Technology (Exton, PA) is designed for feasibility studies in batches from 75 mL to 400 mL. The mill consistently reduces particle size to less than 200 nm. The machine uses Netzsch's patented, dynamic-cartridge media-separation system. The system's agitator shaft accelerates grinding media away from a cylindrical screen, thus providing superior separation and even distribution of the grinding media. The system also improves the particle-size distribution of the final product.

The separation system reduces wear on the unit and provides precise temperature control. The machine's zirconium-oxide chamber components also reduce wear and prevent metal contamination in the product. Operators can work with batches as small as 75 mL. The mill's results are scalable to production quantities.